The interfaces of short-period GaAs/AlAs superlattices grown oil GaAs
(001) and (113)A surfaces are investigated by means of reflection high
-energy-electron diffraction(RHEED) and Raman spectroscopy. RHEED inve
stigations during growth of the heterostructures reveal an intermixed
normal (AlAs-on-GaAs) interface while the inverted one is seen to be a
brupt. We measured the Raman shifts of the GaAs-like confined optical
phonons. in [001] grown superlattices, we determine the thickness of t
he intermixed region at the normal interface by comparison of the phon
on wave vectors with the dispersion curve. This procedure is also appl
ied to the [113] grown samples, where a splitting of the confined LO3
modes confirms the presence of an interface corrugation. We determine
the height of the corrugation to be 3.4 Angstrom, (two bilayers) at on
e interface while the other one is intermixed. This model is used for
a reinterpretation of previously published Raman data [da Silva er nl.
, Phys. Rev. B 53, 1927 (1996)] leading to a better agreement between
experiment and theory.