This paper deals with the coherent and the incoherent microdiffraction
, as well as their applications, for example, determination of the nat
ure of defects and boundaries, measurement of the strain field and ide
ntification of the symmetry, etc. The localized structure information
obtained from microdiffraction has been compared with and complements
that provided by HREM. (C) 1998 Wiley-Liss, Inc.