M. Veszelei et al., OPTICAL AND ELECTROCHEMICAL PROPERTIES OF LI-CE OXIDE AND HF-CE OXIDE-FILMS( INTERCALATED ZR), Journal of applied physics, 83(3), 1998, pp. 1670-1676
Sputter deposited Zr-Ce oxide and Hf-Ce oxide films were investigated
with regard to structure, optical absorption, and electrochemical prop
erties. X-ray diffractometry and Rutherford backscattering spectrometr
y showed that polycrystalline Zr-Ce oxide and Hf-Ce oxide films had cu
bic crystal structures for 40-100 mol% CeO2 and 50-100 mol % CeO2, res
pectively. Cyclic voltammetry was performed in an electrolyte of propy
lene carbonate containing LiClO4. The charge capacity was similar to 6
0 mC/cm(2) mu m for a Zr-Ce oxide film with a Ce/Zr atom ratio of simi
lar to 13 as well as for a Hf-Ce oxide film with a Ce/Hf atom ratio of
similar to 2. A decrease of the charge capacity was noted after simil
ar to 1000 voltammetric cycles, with the mixed oxide films being far m
ore stable than CeO2. In situ Optical transmittance measurements showe
d that both Zr-Ce and Kf-Ce oxide films remained essentially transpare
nt during Li+ intercalation. Chronopotentiometry measurements were use
d to elucidate effects of the electronic structure during Li+ intercal
ation. (C) 1998 American Institute of Physics. [S0021-8979(98)08303-0]
.