DISLOCATION CONTENT OF MICROPIPES IN SIC

Authors
HEINDL J DORSCH W STRUNK PP MULLER SG ECKSTEIN R HOFMANN D WINNACKER A
Citation
J. Heindl et al., DISLOCATION CONTENT OF MICROPIPES IN SIC, Physical review letters, 80(4), 1998, pp. 740-741
Citations number
10
Categorie Soggetti
Physics
Journal title
Physical review letters → ACNP
ISSN journal
00319007
Volume
80
Issue
4
Year of publication
1998
Pages
740 - 741
Database
ISI
SICI code
0031-9007(1998)80:4<740:DCOMIS>2.0.ZU;2-9
Abstract
Silicon carbide, a potentially powerful device material, suffers from microscopic hollow defects called micropipes. Their nature is not sati sfactorily clarified yet. Our analysis shows that they are hollow core dislocations according to Frank's model, but contain dislocations of mixed type. [S0031-9007(97)05011-4].