NONCOARSENING ORIGIN OF LOGARITHMIC-NORMAL SIZE DISTRIBUTIONS DURING CRYSTALLIZATION OF AMORPHOUS THIN-FILMS

Authors
BERGMANN RB SHI FG KRINKE J
Citation
Rb. Bergmann et al., NONCOARSENING ORIGIN OF LOGARITHMIC-NORMAL SIZE DISTRIBUTIONS DURING CRYSTALLIZATION OF AMORPHOUS THIN-FILMS, Physical review letters, 80(5), 1998, pp. 1011-1013
Citations number
15
Categorie Soggetti
Physics
Journal title
Physical review letters → ACNP
ISSN journal
00319007
Volume
80
Issue
5
Year of publication
1998
Pages
1011 - 1013
Database
ISI
SICI code
0031-9007(1998)80:5<1011:NOOLSD>2.0.ZU;2-U
Abstract
It is demonstrated that the formation of logarithmic-normal crystallit e size distributions during crystallization of amorphous thin films ca n be a consequence of the dynamics of random nucleation and growth wit hout the involvement of coarsening. Our analytical result is supported by experimentally observed crystallite size distributions during the crystallization of amorphous Si thin films obtained from transmission electron microscopy.