INDIUM OXIDE THIN-FILM HOLOGRAPHIC RECORDERS GROWN BY EXCIMER-LASER REACTIVE SPUTTERING

Growth of indium oxide (In2O3) thin films on glass substrates is perfo rmed by pulsed laser ablation of a metallic indium target in an oxygen atmosphere. X-ray diffraction analysis verifies that a transition, fr om amorphous to polycrystalline film growth, occurs at a temperature o f 150 degrees C. Films grown under optimized conditions exhibit optica l transmission higher than 80% in the visible light. Ultraviolet radia tion (lambda = 325 nm) induced dynamic holographic recording in films deposited at specific temperature and oxygen pressure settings is also demonstrated.