VALENCE-BAND DENSITY-OF-STATES OF THE MANGANESE SILICIDES STUDIED BY SOFT-X-RAY EMISSION-SPECTROSCOPY

Electronic states of manganese silicides with the composition of MnSi or MnSi1.7 were investigated by soft X-ray emission spectroscopy The f ormation of MnSi and MnSi1.7 with single phase was identified by X-ray diffraction. Si-K-beta and Si-L-2,L-3 emission-band spectra were meas ured, where the Si-K-beta reflects the valence-hand density of states with p-symmetry and the latter reflects the one with s- and/or d-symme try. The spectrum of Si-L-2,L-3 for MnSi1.7 was different from that of MnSi. The origin of this difference is discussed in comparison with t hose of other silicides.