DETERMINATION OF LIGHT-ELEMENTS USING X-RAY SPECTROMETRY PART-II - BORON IN GLASS

Two methods that allow the determination of the boron content in a gla ss or a flux were compared. The first method uses direct measurement o f B K alpha fluorescence and subsequent fundamental parameter-based qu antification. Although it can be used for low concentrations of B, it requires extra care with calibration because the fundamental parameter s for boron depend on the chemical environment. The second method reli es on the use of Compton-scattered radiation to determine boron as a l ight fraction in an otherwise known matrix. This method does not requi re matrix-dependent calibration, but it is insensitive for boron conce ntrations below about 4% of B2O3. The preferred approach is a combinat ion of both methods. (C) 1998 John Wiley & Sons, Ltd.