METHOD OF CRITICAL DISTANCES FOR STOCHASTIC ASSESSMENT OF VOLTAGE SAGS

Authors
BOLLEN MHJ
Citation
Mhj. Bollen, METHOD OF CRITICAL DISTANCES FOR STOCHASTIC ASSESSMENT OF VOLTAGE SAGS, IEE proceedings. Generation, transmission and distribution, 145(1), 1998, pp. 70-76
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
IEE proceedings. Generation, transmission and distribution → ACNP
ISSN journal
13502360
Volume
145
Issue
1
Year of publication
1998
Pages
70 - 76
Database
ISI
SICI code
1350-2360(1998)145:1<70:MOCDFS>2.0.ZU;2-1
Abstract
A fast method is presented for obtaining a first estimate of the expec ted number of spurious trips due to voltage sags. The method is based on an expression for the so called critical distance (the radius of th e exposed area in which faults lead to equipment trips) in radial syst ems. Extensions of the method for nonradial systems, and transfer of s ags due to single-phase and phase-to-phase faults to lower voltages ar e also presented.