IMAGING OF RANDOM SURFACES AND INVERSE SCATTERING IN THE KIRCHOFF APPROXIMATION

Imaging of random surfaces can be modelled by integration over angular spectra of scattered plane waves. This approach suggests the represen tation of surface scattering in the Kirchhoff approximation using the concept of three-dimensional spatial frequencies. Optical methods of s urface profiling can thus be modelled, leading to an insight into reco nstruction of surface profiles from scattering data. The methods can a lso be extended to cover thin-film multilayer structures.