L. Zhu et K. Wu, REVISITING CHARACTERISTIC IMPEDANCE AND ITS DEFINITION OF MICROSTRIP LINE WITH A SELF-CALIBRATED 3-D MOM SCHEME, IEEE microwave and guided wave letters, 8(2), 1998, pp. 87-89
Characteristic impedance and its definition are revisited and discusse
d for microstrip line with a self-calibrated three-dimenional (3-D) me
thod of moments (MoM). This 3-D MoM accommodates a scheme called short
-open calibration (SOC) so that potential parasitic effects brought by
the impressed voltage excitation and other relevant factors can be ef
fectively removed, In this way, the characteristic impedance can be ac
curately defined through a relationship between equivalent voltage and
current on the two sides of a microstrip line having a finite length.
Simulated results are compared with the Jansen's two-dimensional(2-D)
and Rautio's 3-D definition.