REVISITING CHARACTERISTIC IMPEDANCE AND ITS DEFINITION OF MICROSTRIP LINE WITH A SELF-CALIBRATED 3-D MOM SCHEME

Authors
Citation
L. Zhu et K. Wu, REVISITING CHARACTERISTIC IMPEDANCE AND ITS DEFINITION OF MICROSTRIP LINE WITH A SELF-CALIBRATED 3-D MOM SCHEME, IEEE microwave and guided wave letters, 8(2), 1998, pp. 87-89
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
10518207
Volume
8
Issue
2
Year of publication
1998
Pages
87 - 89
Database
ISI
SICI code
1051-8207(1998)8:2<87:RCIAID>2.0.ZU;2-P
Abstract
Characteristic impedance and its definition are revisited and discusse d for microstrip line with a self-calibrated three-dimenional (3-D) me thod of moments (MoM). This 3-D MoM accommodates a scheme called short -open calibration (SOC) so that potential parasitic effects brought by the impressed voltage excitation and other relevant factors can be ef fectively removed, In this way, the characteristic impedance can be ac curately defined through a relationship between equivalent voltage and current on the two sides of a microstrip line having a finite length. Simulated results are compared with the Jansen's two-dimensional(2-D) and Rautio's 3-D definition.