DEFECT FORMATION IN SI AND GAAS SINGLE-CR YSTAL WAFERS SUBJECTED TO MECHANICAL TREATMENT

Authors
KOLEV D MILVIDSKII MG NOVIKOV AG SOKOLOVA NS FOMIN VG
Citation
D. Kolev et al., DEFECT FORMATION IN SI AND GAAS SINGLE-CR YSTAL WAFERS SUBJECTED TO MECHANICAL TREATMENT, Kristallografia, 42(1), 1997, pp. 141-144
Citations number
3
Categorie Soggetti
Crystallography
Journal title
Kristallografia → ACNP
ISSN journal
00234761
Volume
42
Issue
1
Year of publication
1997
Pages
141 - 144
Database
ISI
SICI code
0023-4761(1997)42:1<141:DFISAG>2.0.ZU;2-7