Temperature-and electric-field-dependent mobility measurements of poly
crystalline alpha-sexithiophene thin films, which form the active laye
r in field-effect transistors, are reported and are found to be strong
ly sample dependent. In samples with significant charge trapping, the
mobility at temperatures greater than 50 K occurs by thermally activat
ed hopping. There is a correlation between the extent of charge trappi
ng and the magnitude of the field-effect mobility. In most samples, th
e field-effect mobility at temperatures less than 40 K is approximatel
y temperature independent, but with an absolute value that is sample d
ependent. If the effects of trapping are neglected, the mobility in th
ese field effect transistors possesses two main components: a nearly t
emperature-independent component and a temperature activated component
.