ELECTRONOGRAPHIC INVESTIGATION OF SHORT-RANGE ORDER IN THE SURFACE-LAYERS OF MELTS

Citation
Si. Popel et al., ELECTRONOGRAPHIC INVESTIGATION OF SHORT-RANGE ORDER IN THE SURFACE-LAYERS OF MELTS, Czechoslovak journal of Physics, 47(4), 1997, pp. 455-460
Citations number
5
Categorie Soggetti
Physics
ISSN journal
00114626
Volume
47
Issue
4
Year of publication
1997
Pages
455 - 460
Database
ISI
SICI code
0011-4626(1997)47:4<455:EIOSOI>2.0.ZU;2-5
Abstract
The examination of the structure of the surface layers in melts by the reflection electron diffraction has detected a shift of the diffracti on bars due to the surface monolayer and subsequent atomic layers. The magnitude of the shift depends on the surface layer thickness. An ana lysis of structure curves revealed a difference between the first mono atomic layer and the bulk.