Si. Popel et al., ELECTRONOGRAPHIC INVESTIGATION OF SHORT-RANGE ORDER IN THE SURFACE-LAYERS OF MELTS, Czechoslovak journal of Physics, 47(4), 1997, pp. 455-460
The examination of the structure of the surface layers in melts by the
reflection electron diffraction has detected a shift of the diffracti
on bars due to the surface monolayer and subsequent atomic layers. The
magnitude of the shift depends on the surface layer thickness. An ana
lysis of structure curves revealed a difference between the first mono
atomic layer and the bulk.