LAUE ASTERISM AND HIGH-TEMPERATURE DEFORMATION OF IRON-DOPED NIAL SINGLE-CRYSTAL

Samples of iron doped NiAl single crystal were uniaxially compressed a t temperatures up to 1673 K and a strain rate of 10(-3) s(-1), and wer e then studied with Laue back reflection method based on a STOE imagin g plate diffraction system (IPDS). Asterism was observed for every def ormed sample, which is an indication of orientation distribution and l attice distortion. A single Taylor axis can often, though not always b e determined locally. However, different Taylor axes have been observe d within a single sample, which could refer to multiple slip activated by plastic deformation. Possible slip systems can be deduced by study ing Laue asterism combined with other measurements such as surface sli p trace analysis. Furthermore, structure refinement has been carried o ut with the integrated intensity of distorted reflections. (C) 1997 El sevier Science S.A.