INFLUENCE OF PULSED-LASER RADIATION ON THE REAL STRUCTURE OF CDTE SINGLE-CRYSTALS

Back-reflection x-ray diffraction topography is used the measure the r eal structure of the surface layer of CdTe single crystals. It is foun d that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discu ssed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. (C) 1998 American Institute of Physics.