SAMPLE TEMPERATURE-MEASUREMENT IN A SCANNING NEAR-FIELD OPTICAL MICROSCOPE

Citation
D. Kazantsev et al., SAMPLE TEMPERATURE-MEASUREMENT IN A SCANNING NEAR-FIELD OPTICAL MICROSCOPE, Applied physics letters, 72(6), 1998, pp. 689-691
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
6
Year of publication
1998
Pages
689 - 691
Database
ISI
SICI code
0003-6951(1998)72:6<689:STIASN>2.0.ZU;2-V
Abstract
The luminescence of GaAs quantum-well-based microstructures was invest igated with a scanning near-field optical microscope at different ambi ent temperatures. The scanning tip was fabricated from an optical fibe r. The excitation laser beam (514 nm, 100-300 mW) was focused onto the opposite end of the fiber. The carrier distribution in the sample was investigated using the high-energy tail of the luminescence peak. Tem perature fits show no overheating of the sample despite the expected h igh temperatures of the tip. (C) 1998 American Institute of Physics.