NEXT-GENERATION METROLOGY MUST MEET CHALLENGES

Authors
DIEBOLD AC MONAHAN K
Citation
Ac. Diebold et K. Monahan, NEXT-GENERATION METROLOGY MUST MEET CHALLENGES, Solid state technology, 41(2), 1998, pp. 50
Citations number
1
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
Solid state technology → ACNP
ISSN journal
0038111X
Volume
41
Issue
2
Year of publication
1998
Database
ISI
SICI code
0038-111X(1998)41:2<50:NMMMC>2.0.ZU;2-X