OPTICAL CHARACTERISTICS OF 1.18-EV LUMINESCENCE BAND COMPLEXES IN N-GAAS-SN(SI) - RESULTS OF A PHOTOLUMINESCENCE STUDY WITH POLARIZED RESONANT EXCITATION
Aa. Gutkin et al., OPTICAL CHARACTERISTICS OF 1.18-EV LUMINESCENCE BAND COMPLEXES IN N-GAAS-SN(SI) - RESULTS OF A PHOTOLUMINESCENCE STUDY WITH POLARIZED RESONANT EXCITATION, Semiconductors, 32(1), 1998, pp. 33-39
Experimental values of the polarization of the low-temperature lumines
cence from the VGaSnGa and VGaSiGa complexes in n-GaAs under condition
s of resonant excitation by polarized light propagating along the [110
] or [100] crystal axis are compared with expressions obtained in the
classical dipole approximation for defects with triclinic or monoclini
c symmetry. It is shown that the rotator fraction in the superposition
of rotator and oscillator contributions to the emission of the comple
xes is 17-18%. The direction of the axis of these dipoles, which match
es the experimental data, is consistent with the assumption that the e
ffect of the donor on the vacancy orbitals of a hole localized in the
complex is lower than that of the Jahn-Teller effect. The resulting sy
mmetry of the complex may be monoclinic or triclinic. In either case,
deviation of the optical dipole axis of the complex from the dipole ax
is of an isolated V-Ga vacancy distorted as a result of the Jahn-Telle
r effect is lower for the VGaSnGa and VGaSiGa complexes than for VGaTe
As complexes. This means that the effect of the donor on the electron
structure of the VGaTeAs complexes is greater than in the VGaSnGa and
VGaSiGa complexes. This correlates with the difference in the donor po
sition in these complexes. (C) 1998 American Institute of Physics.