M. Buchler et al., COMPARISON OF THE SEMICONDUCTIVE PROPERTIES OF SPUTTER-DEPOSITED IRON-OXIDES WITH THE PASSIVE FILM ON IRON, Journal of the Electrochemical Society, 145(2), 1998, pp. 378-385
Citations number
41
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
The semiconducting properties of sputtered magnetite (Fe3O4) and oxidi
zed magnetite layers with different Fe(II) contents were compared with
the passive film on iron. Electrochemical impedance spectroscopy and
photoelectrochemical experiments were carried out in berate buffer, pH
8.4. An evaluation of the impedance data according to the Mott-Schott
ky concept showed that the capacitance of all films is linked with the
ir doping concentrations rather than their thicknesses and that the do
ping species of the passive film on iron is Fe(II). For the passive fi
lm a potential-dependent doping concentration was found. Photoelectroc
hemical investigation of the passive film and the sputtered oxide laye
rs showed that for low doping concentrations, the photocurrent increas
es with doping, whereas for high doping concentrations, an increase in
doping leads to a decrease of the photocurrent. Possible causes for t
his effect are discussed. Further, the combination of a light reflecta
nce technique with photocurrent measurements allowed consideration of
light absorption effects in the data treatment and separation of photo
current contributions from the space-charge layer from film-thickness
effects.