SCANNING FORCE MICROSCOPY INVESTIGATION OF SURFACE FORCES AT THE TUNGSTEN OXIDE LITHIUM BORATE INTERFACE/

Authors
HENSLEY DA GAROFALINI SH
Citation
Da. Hensley et Sh. Garofalini, SCANNING FORCE MICROSCOPY INVESTIGATION OF SURFACE FORCES AT THE TUNGSTEN OXIDE LITHIUM BORATE INTERFACE/, Journal of the Electrochemical Society, 145(2), 1998, pp. 669-675
Citations number
22
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
Journal title
Journal of the Electrochemical Society → ACNP
ISSN journal
00134651
Volume
145
Issue
2
Year of publication
1998
Pages
669 - 675
Database
ISI
SICI code
0013-4651(1998)145:2<669:SFMIOS>2.0.ZU;2-7
Abstract
Ultrahigh-vacuum scanning force microscopy (UHV SFM) was used to measu re force-distance (FD) interactions between electrochemically etched c lean and oxidized tungsten tips and an in situ deposited lithium berat e film. For the case of the oxidized tip, application of a potential d ifference between the tip and sample allowed Lithium to be cycled into and back out of the oxide layer in the tungsten tip. Reproducible cha nges in the shape and magnitude of the force-distance interaction were observed.