Mj. Uren et al., INTERFACE STATE CAPTURE CROSS-SECTION MEASUREMENTS ON VACUUM ANNEALEDAND RADIATION DAMAGED SI-SIO2 SURFACES, Journal of the Electrochemical Society, 145(2), 1998, pp. 683-689
Citations number
26
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
The conductance technique can be used to separate two types of fast in
terface state differentiated by a factor of about 20 ratio in capture
cross section. By comparing vacuum annealed oxides, which are dominate
d by P-b defects, with radiation damaged oxides, we infer that the two
types are acceptor and donor states. The conductance measurements are
unable to separate P-b0 and P-b1 on the (100) surface. In vacuum anne
aled samples, the conductance peak broadening is dominated by surface
potential fluctuations, whereas radiation damaged samples have an intr
insically broadened cross section over and above that due to the poten
tial fluctuations.