CORRECTIONS FOR MULTIPLE-SCATTERING IN INTEGRATED ELECTRON-DIFFRACTION INTENSITIES - APPLICATION TO DETERMINATION OF STRUCTURE FACTORS IN THE [001]-PROJECTION OF ALMFE

Approximate methods are described for treating dynamical scattering ef fects in integrated electron diffraction intensities from unknown stru ctures. In the application to AlmFe, (hk0) structure factors have been determined by combining data from two electron diffraction techniques : energy-filtered convergent-beam electron diffraction (CBED) profiles from the (h00) and (hh0) systematic rows and integrated intensity col lected by the precession technique in the [001] projection. The ab ini tio determination of the (h00) and (hh0) structure factors was based o n accurate intensity measurements and n-beam dynamical scattering calc ulations for the systematic row. The remaining (hk0) structure factors were determined from integrated intensities by means of two-beam-like intensity expressions and the effect of other beams was accounted for by a dynamical potential.