The catalytic chemical vapor deposition (cat-CVD), often called ''hot-
wire CVD'', is a new method of growing polycrystalline silicon (poly-S
i) films at low temperatures. The microstructure of such cat-CVD poly-
Si films is investigated by high-resolution transmission electron micr
oscopy. The main microstructural features of these poly-Si films are n
anometer-diameter columnar crystalline grains surrounded by a very thi
n amorphous phase. Good electrical properties, such as large carrier m
obilities of the films, may be attributed to this microstructure.