LARGE ELECTRIC CONDUCTANCE IN THE INTERFACE DIRECTION OF POLAR NONPOLAR DOUBLE-LAYERED HETERO-LANGMUIR-BLODGETT FILMS/

Aluminum, arachidic acid (C-20) multilayered and/or 2-dodecyl-7,7,8,8- tetracyanoquinodimethane (C(12)TCNQ) multilayered Langmuir-Blodgett (L B) films, and aluminum were deposited successively on a substrate. The electric conductance in the interface direction of the upper-Al/C(12) TCNQ/C-20/under-Al structure, upper-Al/C-20/C(12)TCNQ structure, and o ther control structures was measured using the four-point probe method . The electric conductance in the interface direction of only the uppe r-Al/C(12)TCNQ/C-20/under-Al structure with the number of deposited LB layers between 3 and 5 was 10 or 100 times larger than that of the co ntrol structures, including aluminum thin films.