IMPROVEMENT OF THE MEASUREMENT PRECISION IN AN X-RAY STRESS MEASUREMENT METHOD FOR VERY SMALL AREAS ON SINGLE-CRYSTALS

Authors
FUJII N INUI K KOZAKI S
Citation
N. Fujii et al., IMPROVEMENT OF THE MEASUREMENT PRECISION IN AN X-RAY STRESS MEASUREMENT METHOD FOR VERY SMALL AREAS ON SINGLE-CRYSTALS, JPN J A P 1, 37(1), 1998, pp. 371-372
Citations number
2
Categorie Soggetti
Physics, Applied
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
37
Issue
1
Year of publication
1998
Pages
371 - 372
Database
ISI
SICI code
Abstract
In an X-ray stress measurement method designed for very small areas on single crystals, the following two measures were put into practice to achieve high-precision measurement. (1) The number of measurements of lattice strains was increased. (2) The distance between diffraction s pots from a standard sample and a sample for measurement were made as close as possible, and thereby the positions of these spots were measu red. As a result, we were able-to decrease the measurement error to be low +/-10 MPa and +/-5 degrees.