PRECISION-MEASUREMENTS OF THE WAVELENGTHS OF SPECTRAL-LINES OF MULTIPLY-CHARGED KRYPTON AND ARGON IONS FORMED IN A GAS-TARGET HEATED BY LASER-RADIATION

The first precision (with an error of 0.4 - 1.6 m Angstrom) measuremen ts were made of the wavelengths of x-ray spectral lines emitted as a r esult of n = 4-n' = 2 transitions in the Ne-and Na-like Kr XXVII and K r XXVI ions, The spectra were recorded by means of a spectrograph with a spherically bent mica crystal, characterised by a spectral resoluti on lambda/Delta lambda approximate to 5 x 10(3), The dispersion charac teristic of this crystal was determined with the aid of reference line s, which were emitted by the He-like Ar XVII ion, The wavelengths of a series of dielectronic satellites of the resonance line of the ArXVII ion were identified and measured, The results obtained were compared with calculated data.