Av. Kabashin et Pi. Nikitin, INTERFEROMETER BASED ON A SURFACE-PLASMON RESONANCE FOR SENSOR APPLICATIONS, Quantum electronics, 27(7), 1997, pp. 653-654
An interferometric method was used for the first time to detect, under
surface-plasmon resonance conditions, phase changes in a reflected be
am caused by changes in the refractive index of the medium being diagn
osed. The threshold of the sensitivity to changes in the refractive in
dex was estimated to be 4 x 10(-8). The proposed interferometer can be
used successfully in bio and chemical-sensor systems.