Tjc. Hosea et G. Rowland, PHOTOMODULATED REFLECTANCE OF TENSILELY STRAINED INGAAS INGAASP QUANTUM-WELL STRUCTURES/, Semiconductor science and technology, 13(2), 1998, pp. 207-213
Room-temperature photomodulated reflectance (PR) has been performed on
a series of tensilely strained In1-xGaxAs undoped multiple quantum we
ll (QW) structures with In0.80Ga0.20As0.43P0.57 barriers, which were l
attice matched to an InP substrate. The nominal QW Ga composition vari
ed from x = 0.467 to 0.684 corresponding to tensile strains between ze
ro and 1.5%, respectively. In this range of strain, the QW heavy-hole
(HH) and light-hole (LH) ground-state zone-centre excitonic transition
s increase in energy, with the HH varying more rapidly, with the resul
t that it moves from energies below that of the LH, in the unstrained
wells, to above the LH, at the highest strain. The variation in the LH
and HH energies with strain is measured using PR which is able to res
olve these two transitions even when they are almost degenerate, which
occurs at (0.39 +/- 0.02)% tensile strain. The results from the PR me
asurements are also compared with room-temperature photoluminescence a
nd photovoltage measurements on samples from the same wafers. The expe
rimental results are shown to compare well with theoretical QW calcula
tions based on an effective mass formalism.