ON CONCURRENT MULTIPLE ERROR DIAGNOSABILITY IN LINEAR ANALOG CIRCUITSUSING CONTINUOUS CHECKSUM

Although most of the work done in fault tolerance is in the digital fi eld, it is widely understood that error detection and correction capab ility in analog circuits has the same importance as in digital circuit s. The technique proposed by Abhijit Chatterjee can realize concurrent single error detection and correction in linear analog circuits well. Based on his work, this paper addresses concurrent multiple error det ection and correction in linear analog systems, which is known to be a difficult and unsolved problem. We prove that the concurrent error di agnosis scheme using continuous checksum can not be extended to the ca se of multiple errors under the assumption that the checker and the fu nctional block will not fail simultaneously, though people are still a ttempting to make such an extension. (C) 1998 John Wiley gr Sons, Ltd.