STUDY ON THE ELECTRICAL-CONDUCTION OF P(+) POROUS SILICON

Citation
Ecc. Yeh et al., STUDY ON THE ELECTRICAL-CONDUCTION OF P(+) POROUS SILICON, Physica status solidi. a, Applied research, 165(1), 1998, pp. 63-67
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
165
Issue
1
Year of publication
1998
Pages
63 - 67
Database
ISI
SICI code
0031-8965(1998)165:1<63:SOTEOP>2.0.ZU;2-R
Abstract
In this work, we present the electrical properties of metal/p(+) porou s silicon (PS)/p(+) c-Si/Au cells with the PS layers prepared by diffe rent anodization conditions. It is shown that the anodization paramete rs affect the geometrical interconnections of these PS samples and the corresponding electrical properties are different from one another. D ifferent conduction characteristics, namely the Ohm's law, Schottky re ctification, Pool-Frenkel type conduction, injection power law, and po ssibly hopping transport have been observed in the samples with certai n treatments. It is suggested that the transport property of p(+) PS i s a competition among interfaces; Si interconnected channels, and surf ace channels.