In this work, we present the electrical properties of metal/p(+) porou
s silicon (PS)/p(+) c-Si/Au cells with the PS layers prepared by diffe
rent anodization conditions. It is shown that the anodization paramete
rs affect the geometrical interconnections of these PS samples and the
corresponding electrical properties are different from one another. D
ifferent conduction characteristics, namely the Ohm's law, Schottky re
ctification, Pool-Frenkel type conduction, injection power law, and po
ssibly hopping transport have been observed in the samples with certai
n treatments. It is suggested that the transport property of p(+) PS i
s a competition among interfaces; Si interconnected channels, and surf
ace channels.