FABRICATION OF NANOCRYSTALLINE SILICON SUPERLATTICES BY CONTROLLED THERMAL RECRYSTALLIZATION

Citation
L. Tsybeskov et al., FABRICATION OF NANOCRYSTALLINE SILICON SUPERLATTICES BY CONTROLLED THERMAL RECRYSTALLIZATION, Physica status solidi. a, Applied research, 165(1), 1998, pp. 69-77
Citations number
22
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
165
Issue
1
Year of publication
1998
Pages
69 - 77
Database
ISI
SICI code
0031-8965(1998)165:1<69:FONSSB>2.0.ZU;2-#
Abstract
We report the fabrication of nanocrystalline Si superlattices by plasm a-assisted chemical vapor deposition (PECVD) or magnetron sputtering o f nanometer-thick amorphous Si (a-Si) layers followed by high-temperat ure recrystallization. The recrystallization is performed in two steps (rapid thermal pulse annealing and slow ramp-up furnace annealing) an d has been monitored by Raman scattering. The fabrication technique is able to control the size and packing density of Si nanocrystals in th e nc-Si/SiO2 superlattices. Preliminary results on the doping of Si na nocrystals are discussed. Room temperature photoluminescence with a qu antum efficiency of 0.3% is demonstrated.