EXTENDED-CAVITY RIDGE-WAVE-GUIDE LASERS OPERATING AT 1.5-MU-M USING ASIMPLE DAMAGE-INDUCED QUANTUM-WELL INTERMIXING PROCESS

Citation
Sd. Mcdougall et al., EXTENDED-CAVITY RIDGE-WAVE-GUIDE LASERS OPERATING AT 1.5-MU-M USING ASIMPLE DAMAGE-INDUCED QUANTUM-WELL INTERMIXING PROCESS, Electronics Letters, 33(23), 1997, pp. 1957-1958
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
33
Issue
23
Year of publication
1997
Pages
1957 - 1958
Database
ISI
SICI code
0013-5194(1997)33:23<1957:ERLOA1>2.0.ZU;2-N
Abstract
The authors report extended cavity ridge waveguide lasers in InGaAs/In GaAsP, intermixed by damage induced via a silica sputtering process, w ith selective intermixing achieved through photoresist masking. Laser threshold currents indicate passive waveguide losses of 4.4cm(-1).