LOW-TEMPERATURE-GROWN GAAS TUNNEL-JUNCTIONS

Citation
S. Ahmed et al., LOW-TEMPERATURE-GROWN GAAS TUNNEL-JUNCTIONS, Electronics Letters, 33(18), 1997, pp. 1585-1587
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
33
Issue
18
Year of publication
1997
Pages
1585 - 1587
Database
ISI
SICI code
0013-5194(1997)33:18<1585:LGT>2.0.ZU;2-D
Abstract
A GaAs tunnel junction is formed by molecular beam epitaxy at low subs trate temperatures to incorporate excess arsenic, followed by an annea l to precipitate the excess arsenic. This tunnel junction is comparabl e in resistance and peak current density to tunnel junctions grown sto ichiometrically. Owing to the inhomogeneity in this two-phase tunnel j unction, there is only a slight indication of a current peak. This lac k of a valley in the tunnelling characteristic results in a low voltag e drop even for currents in excess of the peak current.