INTERFEROMETER PROFILE EXTRACTION USING CONTINUOUS WAVELET TRANSFORM

Authors
WATKINS LR TAN SM BARNES TH
Citation
Lr. Watkins et al., INTERFEROMETER PROFILE EXTRACTION USING CONTINUOUS WAVELET TRANSFORM, Electronics Letters, 33(25), 1997, pp. 2116-2117
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
33
Issue
25
Year of publication
1997
Pages
2116 - 2117
Database
ISI
SICI code
0013-5194(1997)33:25<2116:IPEUCW>2.0.ZU;2-5
Abstract
The continuous wavelet transform may be used to accurately reconstruct surface profiles from two sets of Fizeau interferometer fringe data. In contrast to standard phase-stepping methods, the data may have any arbitrary phase-step between 0 and pi. The method enables considerable simplification of the measurment apparatus and yields accurate proffl es, even in the presence of noise.