RATCHET EFFECT IN SURFACE ELECTROMIGRATION - SMOOTHING SURFACES BY ANAC FIELD

Citation
I. Derenyi et al., RATCHET EFFECT IN SURFACE ELECTROMIGRATION - SMOOTHING SURFACES BY ANAC FIELD, Physical review letters, 80(7), 1998, pp. 1473-1476
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
80
Issue
7
Year of publication
1998
Pages
1473 - 1476
Database
ISI
SICI code
0031-9007(1998)80:7<1473:REISE->2.0.ZU;2-U
Abstract
We demonstrate that for surfaces that have a nonzero Schwoebel barrier the application of an ac field parallel to the surface induces a net electromigration current that points in the descending step direction. The magnitude of the current is calculated analytically and compared with Monte Carlo simulations. Since a downhill current smoothes the su rface, our results imply that the application of ac fields can aid the smoothing process during annealing and can slow or eliminate the Schw oebel-barrier-induced mound formation during growth. [S0031-9007(97)05 220-4].