SILICON BIPOLAR IC FOR PRBS TESTING GENERATES ADJUSTABLE BIT RATES UPTO 25 GBIT S/

Authors
Citation
F. Schumann et J. Bock, SILICON BIPOLAR IC FOR PRBS TESTING GENERATES ADJUSTABLE BIT RATES UPTO 25 GBIT S/, Electronics Letters, 33(24), 1997, pp. 2022-2023
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
33
Issue
24
Year of publication
1997
Pages
2022 - 2023
Database
ISI
SICI code
0013-5194(1997)33:24<2022:SBIFPT>2.0.ZU;2-5
Abstract
For the first lime, a completely integrated pseudo-random pattern gene rator providing adjustable bit rates up to at least 25 Gbit/s without additional external multiplexing is presented. The sequence length is 2(7) - 1. The application of the monolithic Si bipolar IC serves as a single chip measurement instrument for pseudo-random binary sequence ( PRBS) generation required for the characterisation and development of high-speed components used in future optical fibre communication syste ms. Only three external microwave components are needed for operation: a clock generator, a power divider and a phase shifter. The chip is r ealised in an advanced implanted base silicon bipolar technology.