Tp. Nguyen et al., SPECTROSCOPIC STUDY OF THE CONVERSION OF THE PRECURSOR INTO POLY(P-PHENYLENE VINYLENE) FILMS, Synthetic metals, 84(1-3), 1997, pp. 679-680
The conversion of the precursor into poly(p-phenylene vinylene) PPV fi
lms has been studied by X ray photoelectron spectroscopy (XPS) and ele
ctron spin resonance (ESR) technique in the temperature range from 25
to 300 degrees C. XPS results revealed that the PPV films may contain
impurities on their surface depending on the nature of the precursor u
sed while ESR analysis showed a progressive disappearance of the radic
als formed on the sulfur sites upon heating. These complementary studi
es allowed us to determine the optimum rate of the conversion process.