MICROCAVITY OPTICAL-MODE STRUCTURE MEASUREMENTS VIA ABSORPTION AND EMISSION OF POLYMER THIN-FILMS

Citation
Se. Burns et al., MICROCAVITY OPTICAL-MODE STRUCTURE MEASUREMENTS VIA ABSORPTION AND EMISSION OF POLYMER THIN-FILMS, Synthetic metals, 84(1-3), 1997, pp. 887-888
Citations number
9
Categorie Soggetti
Physics, Condensed Matter","Material Science","Polymer Sciences
Journal title
ISSN journal
03796779
Volume
84
Issue
1-3
Year of publication
1997
Pages
887 - 888
Database
ISI
SICI code
0379-6779(1997)84:1-3<887:MOSMVA>2.0.ZU;2-#
Abstract
Langmuir-Blodgett deposition was used to control the positions of lumi nescent thin films of the polymer substituted poly(p-phenylene) (SPPP) within metal mirror microcavities. In this way, the position of the a bsorbing/emitting layers were precisely defined, permitting the optica l mode structure of the cavities to be probed by both the emission and absorption of the chromophore. It was demonstrated that the spontaneo us emission from a thin film of chromophore varied as a function of th e optical electric field intensity within the microcavity and was ther efore dependant on its position within the cavity. The absorption of t he chromophore film was investigated by coupling the ultraviolet excit ation source to the cavity mode and was also found to vary as a functi on of the optical electric field intensity of the cavity mode.