Se. Burns et al., MICROCAVITY OPTICAL-MODE STRUCTURE MEASUREMENTS VIA ABSORPTION AND EMISSION OF POLYMER THIN-FILMS, Synthetic metals, 84(1-3), 1997, pp. 887-888
Langmuir-Blodgett deposition was used to control the positions of lumi
nescent thin films of the polymer substituted poly(p-phenylene) (SPPP)
within metal mirror microcavities. In this way, the position of the a
bsorbing/emitting layers were precisely defined, permitting the optica
l mode structure of the cavities to be probed by both the emission and
absorption of the chromophore. It was demonstrated that the spontaneo
us emission from a thin film of chromophore varied as a function of th
e optical electric field intensity within the microcavity and was ther
efore dependant on its position within the cavity. The absorption of t
he chromophore film was investigated by coupling the ultraviolet excit
ation source to the cavity mode and was also found to vary as a functi
on of the optical electric field intensity of the cavity mode.