We report on x-ray structural and optical measurements on two types of
organic materials: Polypyrrole (PPY) free-standing films produced by
electrodeposition, and doped with p-toluenesulfonate, which exhibit me
tallic character; and thin films of para-Hexaphenyl (PHP) (an oligomer
of poly(para-phenylene) which has been successfully used in blue ligh
t emitting diodes) produced by molecular beam deposition on glass subs
trates showing dielectric, semiconducting character. X-ray diffraction
measurements reveal that both film types show a well ordered structur
e leading to anisotropy, but with a different chain orientation govern
ed by the film growth mechanism. The PHP films grow with chains orient
ed near-normal to the substrate surface, while the chains in PPY films
lie predominantly in the film plane. Refractive indices and absorptio
n coefficients, calculated from optical reflectance and transmission s
pectra, exhibit a pronounced microstructure dependence, where the refr
active indices of PPY in the infra-red region were strongly influenced
by the doping methods.