DESIGN AND PERFORMANCE OF A LOW-NOISE, LOW-POWER CONSUMPTION CMOS CHARGE AMPLIFIER FOR CAPACITIVE DETECTORS

Citation
Y. Hu et al., DESIGN AND PERFORMANCE OF A LOW-NOISE, LOW-POWER CONSUMPTION CMOS CHARGE AMPLIFIER FOR CAPACITIVE DETECTORS, IEEE transactions on nuclear science, 45(1), 1998, pp. 119-123
Citations number
6
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
45
Issue
1
Year of publication
1998
Pages
119 - 123
Database
ISI
SICI code
0018-9499(1998)45:1<119:DAPOAL>2.0.ZU;2-1
Abstract
In this paper, a new design of low noise, low-power consumption charge amplifier is described. Theoretical results show that a total output noise voltage reduction of 0.264 mV has been obtained. This value corr esponds to a 46% reduction compared to the noise performance of a conv entional charge amplifier. A complete readout system including the pro posed charge amplifier has been realized in a 0.8-mu m semiconductor o n insulator (SOI) bipolar complementary metal-oxide-semiconductor (BIC MOS) process. A measured noise performance of 450 electrons at O pF wi th a slope of 44 electrons/pF for a shaping time of 45 ns, a conversio n gain of 20 mV/fC and 1-mW power consumption have been obtained.