J. Viefhaus et al., INTERFERENCE EFFECTS BETWEEN AUGER AND PHOTOELECTRON STUDIED BY SUBNATURAL LINEWIDTH AUGER-PHOTOELECTRON COINCIDENCE SPECTROSCOPY, Physical review letters, 80(8), 1998, pp. 1618-1621
Using subnatural linewidth Auger-photoelectron coincidence spectroscop
y following linearly polarized synchrotron radiation excitation we hav
e measured the triply differential double photoionization cross sectio
n of xenon at a photon energy of 97.5 eV. At this photon energy the ki
netic energy of the 4d(5/2) photoelectron line matches exactly the pos
ition of the S-1(0) N5O2.3O2.3 Auger line and therefore the two electr
ons are indistinguishable. Lf the two electrons are emitted back to ba
ck in the plane of polarization the triply differential cross section
fully vanishes.