A NOVEL APPLICATION OF ATOMIC-FORCE MICROSCOPE TO IDENTIFY THE AG ANDI PLANES OF BETA-AGI SINGLE-CRYSTALS

Authors
BHALLA AS MANIVANNAN A
Citation
As. Bhalla et A. Manivannan, A NOVEL APPLICATION OF ATOMIC-FORCE MICROSCOPE TO IDENTIFY THE AG ANDI PLANES OF BETA-AGI SINGLE-CRYSTALS, MATERIALS RESEARCH INNOVATIONS, 1(3), 1997, pp. 197-203
Citations number
5
Categorie Soggetti
Material Science
Journal title
MATERIALS RESEARCH INNOVATIONS → ACNP
ISSN journal
14328917
Volume
1
Issue
3
Year of publication
1997
Pages
197 - 203
Database
ISI
SICI code
1432-8917(1997)1:3<197:ANAOAM>2.0.ZU;2-3
Abstract
Atomic Force Microscopy is used to determine the crystallographic pola rity of the surfaces of beta-AgI single crystals. The studies reveal t hat the hexagonal packed Ag+ plane is the (001) and the I- plane is th e (001). This observation is also consistent with the earlier x-ray di ffraction measurements and chemical etching techniques as well as the polarizability and electronegativity of the ions.