EXTENDED FINE-STRUCTURE IN CHARACTERISTIC X-RAY-FLUORESCENCE - A NOVEL STRUCTURAL-ANALYSIS METHOD OF CONDENSED SYSTEMS

An oscillation similar to that in extended X-ray absorption fine struc ture (EXAFS) is found in characteristic X-ray fluorescence spectra, or iginating from a quantum interference effect during the X-ray emission process in a solid. We observe the oscillating fine structure in the radiative Auger X-ray fluorescence spectra of aluminum metal. The Al-A l interatomic distances are successfully reproduced by the Fourier tra nsform of the fine structure. Thus, the present method has the potenti al to become a convenient alternative to EXAFS measurement for light e lements. (C) 1997 Elsevier Science B.V.