INTEGRATING ONLINE AND OFFLINE TESTING OF A SWITCHING MEMORY

Authors
BARBAGALLO S MEDINA D CORNO F PRINETTO P REORDA MS
Citation
S. Barbagallo et al., INTEGRATING ONLINE AND OFFLINE TESTING OF A SWITCHING MEMORY, IEEE design & test of computers, 15(1), 1998, pp. 63-70
Citations number
7
Categorie Soggetti
Computer Science Hardware & Architecture","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
15
Issue
1
Year of publication
1998
Pages
63 - 70
Database
ISI
SICI code
0740-7475(1998)15:1<63:IOAOTO>2.0.ZU;2-D
Abstract
A circuit used in a telephone switching unit features several test tec hniques, including BIST, partial scan, and boundary scan. By sharing t he same circuitry for both online and offline testing, the design mini mizes additional logic while achieving very high fault coverage.