E. Rozenberg et al., MORPHOLOGICAL-CHANGES INDUCED BY THERMAL ANNEALS IN NIFE AG MULTILAYERS - THEIR RELATION TO THE RESISTIVE AND MAGNETORESISTIVE PROPERTIES/, Thin solid films, 310(1-2), 1997, pp. 171-176
X-ray diffraction and simulation were used to characterize the morphol
ogical evolution that takes place in permalloy/silver (NiFe/Ag) multil
ayers as the result of thermal annealing. Auger spectroscopy, electron
microscopy, resistivity and magnetoresistivity measurements were perf
ormed in order to obtain additional insight into the results. The resu
lts are consistent with the model of Ag grain boundary diffusion takin
g place along the columnar grains, leading to the creation of so-calle
d 'silver bridges' between the permalloy grains. The initial stages of
annealing (up to 633 K) result in formation of individual NiFe grains
that leads to enhanced values of the magnetoresistivity. Annealing at
higher temperatures causes the growth of relatively large Ag and NiFe
agglomerates and results in breakup of the original multilayered stru
cture. (C) 1997 Elsevier Science S.A.