ELECTRONIC-STRUCTURES OF THE SI(001)2X3-AG SURFACE

Citation
Hw. Yeom et al., ELECTRONIC-STRUCTURES OF THE SI(001)2X3-AG SURFACE, Physical review. B, Condensed matter, 57(7), 1998, pp. 3949-3954
Citations number
30
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
57
Issue
7
Year of publication
1998
Pages
3949 - 3954
Database
ISI
SICI code
0163-1829(1998)57:7<3949:EOTSS>2.0.ZU;2-A
Abstract
Electronic structures of the double-and single-domain Si(001)2X3-Ag su rfaces were investigated by angle-resolved photoelectron spectroscopy using synchrotron radiation. All the surface states related to Si dime rs are shown to disappear upon forming the 2X3-Ag phase. Instead, five surface-state bands are identified within the bulk band gap with bind ing energies 0.8-2.6 eV, whose dispersions are determined for symmetri c lines of the surface Brillouin zone. The Si(001)2X3-Ag surface is cl early shown to be semiconducting with a band gap larger than 0.8 eV. T his result can be in significant conflict with the presently available structure models of this surface phase. [S0163-1829(98)01907-9].