APPLICATIONS OF SCANNING-TUNNELING-MICROSCOPY TO SOLID-STATE PHYSICS

Authors
VANKEMPEN H BOON EJG VANDERWIELEN MCMM WILDOER JWG PRINS MWJ JANSEN R SCHAD R
Citation
H. Vankempen et al., APPLICATIONS OF SCANNING-TUNNELING-MICROSCOPY TO SOLID-STATE PHYSICS, Acta Physica Polonica. A, 93(2), 1998, pp. 323-331
Citations number
22
Categorie Soggetti
Physics
Journal title
Acta Physica Polonica. A → ACNP
ISSN journal
05874246
Volume
93
Issue
2
Year of publication
1998
Pages
323 - 331
Database
ISI
SICI code
0587-4246(1998)93:2<323:AOSTSP>2.0.ZU;2-S
Abstract
Due to the dependence of the tunnel current to material properties lik e work function, density of states, and spin polarization the scanning tunneling microscope can be used to study a number of solid state phy sics problems. This will be illustrated with some examples. The presen ted examples have in common that also the role of the tip properties h ave to be taken explicitly into account.