GaN films grown directly on Si(001) by plasma-assisted molecular beam
epitaxy are found to undergo a structural phase transformation from ep
itaxial growth of the cubic (beta) phase towards textured growth of th
e hexagonal (alpha) phase. The origin of this phase transformation is
investigated and identified to be due to the formation of amorphous Si
xNy material at the GaN/Si interface during the nucleation stage. A Ga
As buffer layer overcomes this problem as evidenced by the phase purit
y of the resulting epitaxial beta-GaN films on GaAs/Si(001). (C) 1998
Elsevier Science B.V.