Differently treated hexagonal GaN(0001) epilayers on Al2O3 substrates
were investigated by high-resolution electron energy-loss spectroscopy
(HREELS) to determine their vibrational properties. X-ray photoemissi
on spectroscopy (XPS), Auger electron spectroscopy (AES), and low-ener
gy electron diffraction (LEED) were utilized to monitor the surface co
mposition and structure, respectively. A comparison was made between s
amples which were cleaned solely by a wet chemical etch prior to inser
tion into the vacuum system and such which were additionally heated in
situ to 800 degrees C first in a Ga-beam and subsequently in UHV. LEE
D investigations exhibited 1 X 1 patterns for both of the preparation
procedures, whereas only for the latter no oxygen contamination was de
tected by XPS and AES. The AES spectra revealed the presence of C whic
h cannot be traced back to hydrocarbon contamination, since the HREEL
spectra showed no such loss features. Electron energy-loss structures
at 700 cm(-1) (86.8 meV) which are attributed to optical Fuchs-Kliewer
phonons were found for both preparation methods. Spectra recorded fro
m heat-treated samples exhibited additional loss features at 565 cm(-1
) (70 meV). These may be attributed to vibrations between Ga and resid
ual C atoms. (C) 1998 Elsevier Science B.V.